Operating system:Window CE 6.0 operating system, safe and reliable
Filter:Equipped with 8 filters that can be automatically switched based on the test elements
Testing method:Basic parameter method, supporting empirical coefficient method correction
Operating system:Window CE 6.0 operating system, safe and reliable
Filter:Equipped with 8 filters that can be automatically switched based on the test elements
Testing method:Basic parameter method, supporting empirical coefficient method correction
Operating system:Window CE 6.0 operating system, safe and reliable
Filter:Equipped with 8 filters that can be automatically switched based on the test elements
Testing method:Basic parameter method, supporting empirical coefficient method correction
Analysis Matrix:Fe, Al, Cu, Zn, Ni, Mg, Pb etc.
Wavelength Range:160~580nm
Detector:High performance CMOS array
Analysis Matrix:Fe, Al, Cu, Zn, Ni, Mg, Pb etc.
Wavelength Range:160~580nm
Detector:High performance CMOS array
Bandwidth:0.5~10
Gain:0~110
Detection range:Range of scanning (mm):0~1000
detection range:0 to 15m
gain ranges:0 to 120dB
sensitivity margin:>65dB
detection range:0 to 15m
gain ranges:0 to 120dB
sensitivity margin:>65dB
Hardness test range:8~2900HV
Test method of force application:Automatic (loading, retaining, unloading)
Test microscope magnification:400X(Measuring),100X(observation)
Hardness test range:8~2900HV
Test method of force application:Automatic (loading, retaining, unloading)
Test microscope magnification:400X(Measuring),100X(observation)
Conversion Scale:Superficial Rockwell, Brinell, Vickers
Dwell time:2-60s
Total load of Rockwell:60kgf(588N) 100kgf(980N) 150kgf(1471N)
Conversion Scale:Superficial Rockwell, Brinell, Vickers
Dwell time:2-60s
Total load of Rockwell:60kgf(588N) 100kgf(980N) 150kgf(1471N)