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Product Details:
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| Test Force: | 3000 Kgf (1000 Kgf, 750 Kgf, 500 Kgf Optional) | Test Range: | 32~650 HBW |
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| Opening Dimension: | 350 Mm (Height) X 100 Mm (Throat Depth) | Test Ball: | 10mm Carbide Alloy Ball (5mm Optional) |
| Display: | 7-inch Multi-touch Display With Backlight Support | Resolution: | High-definition Display, Resolution 1280"800 |
| Storage: | 32GB Intemal Storage, Expandable Up To 128GB | Operating System: | Android OS (based On Linux Kemel) |
| Network Interface: | Supports Wi-FI Connection; Expandable To Support 4G Dangle | ||
| Highlight: | portable ACFM crack detector,ACFM metal surface testing,alternating current field measurement system |
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ACFM-X2 Alternating Current Field Measurement System Portable ACFM Crack Detector for Metal Surface Near-surface Defect Testing Through Paint Epoxy Coating
Applicable Materials:
Ferromagnetic and non-ferromagnetic conductive metals, including carbon steel,stainless steel,aluminum,etc
Applicable Defects:
Capable of effectively detecting surface cracks and other linear defects
Detection Stability:
Minimum defect detection rate greater than 90%
Application Scope:
Detection of surface and near-surface defects in metal structures
Inspection Depth:
Maximum depth for carbon steel is 3mm;for stainless steel is 5mm;for aluminum is 8mm
Permissible Coating Types:
Non-conductive coatings such as paint, epoxy resin,asphalt,etc
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Instrument Requirements:
Maximum Operating Time: 16 hours
Host Dimensions: 225mm *172mm *76mm
Weight: ≤ 2.1kg
Operating Temperature: -10° C to 40° C
Operating Humidity: ≤90% relative air humidity
Hardware Function Requirements:
Supports multiple probe types, including pencil probe and standard probe
Supports conventional multi-element array probes (Optional)
Supports high-temperature probe with synchronous temperature.compensation function (Optional)
Supports encoder for real-time recording of spatial displacement during inspection
Can display Bx signal plan view, Bz signal plan view,buttertly.diagram,and gradient diagram
Supports adjustable inspection frequency,range 1kHz -10kHz
Supports adjustable signal intensity, either automatic or manual adjustment
Supports hot-swapping of probes, allowing probe changes during inspection
Supports hot-swapping and disconnection of the encoder
scanning functions (e.g.,start, stop,refresh)
Supports probe button function: Buttons on the probe can control software
Software Function Requirements:
System software runs on Android platform(Chinese),capable of device control, signal acquisition,analysis, etc.
Software can display status information such as probe connection,inspection parameters,battery level Supports creating new project files, which include basic inspection settings,inspection data,and inspection reports
Supports importing/exporting project files to view or set inspection parameters
Supports parameter settings for part type, material,coating thickness, weld width, part temperature, etc
Software Function Requirements:
*Features parameter recommendation function, suggesting suitable probes and parameters based on set inspection object information
*Features instrument sensitivity adjustment function,allowing calibration using standard test blocks
*Features defect depth coefficient calibration function, allowing depth coetticient setting using reterence test blocks
*Features excitation adjustment function, allowing adjustment of inspection frequency and excitation level based on the inspection object, with automatic adjustment of instrument gain
*Inspection interface vertical axis supports switching between follow mode and fixed mode, adjustable at any time
*Features inspection image zoom function,allowing manual zoom and horizontal dragging for result viewing
*Features image reset function,allowing one-click restoration ot zoomed or dragged images
*Supports inspection image replay function for multiple reviews
*Features marking function. Clicking the mark button during inspection adds dividers to the inspection image for segmented display in reports
*Supports defect sizing function. After identifying a defect, selecting its area allows calculating defect length based on encoder data. Surface opening defect depth can be calculated based on Bx signal variation
*Supports custom inspection report formats and report export function
*Supports viewing inspection reports, images, and data from historical project files
Basic Configuration
Host Unit:1unit
Signal Acquisition and Analysis Software:1 set
Pencil Probe:1 unit
Standard Probe (with encoder): 1 unit
Probe Connection Cable: 1 unit
Charger:1set
Product User Manual: 1 set
Quality Documentation:1 set
Instrument Case:1set
Three-Element Array Probe: Optional
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Contact Person: Ms. Shifen Yuan
Tel: 8610 82921131,8618610328618
Fax: 86-10-82916893