Product Details:
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Display: | TFT,, 320 × 240 TFT LCD Screen | Data Storage: | 510 Files, 46 To 215 Groups (impact Times 32 To 1) |
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Communication Interface Standards: | USB2.0 (RS232,RS485) | Charging Power Supply: | 5VDC,220VAC |
Charging Time: | 2-3hour | Storage Temperature: | -25~70℃ |
Highlight: | Dustproof Leeb Metal Hardness Tester,Dual Bin Leeb Metal Hardness Tester |
RHL-140 Dual Bin Dustproof TFT LCD screen Leeb Metal Hardness Tester
Functional features:
Main technical indicators:
Number | Impact device type | Standard Leeb hardness block hardness value | Indication error | Indication repeatability |
1 | D |
760±30HLD 530±40HLD |
±5 HLD ±8 HLD |
5 HLD 8 HLD |
2 | DC |
760±30HLDC 530±40HLDC |
±5 HLDC ±8 HLDC |
5 HLD 8 HLD |
3 | DL |
878±30HLDL 736±40HLDL |
±10 HLDL | 10 HLDL |
4 | D+15 |
766±30HLD+15 544±40HLD+15 |
±10 HLD+12 | 10 HLD+12 |
5 | G |
590±40HLG 500±40HLG |
±10 HLG | 10 HLG |
6 | E |
725±30HLE 508±40HLE |
±10 HLE | 10 HLE |
7 | C |
822±30HLC 590±40HLC |
±10 HLC | 10 HLC |
Standard configuration:
No. | Item | Quantity | Remarks | |
Standard Configuration | 1 | Main unit | 1 | |
2 | D type impact device | 1 | With cable | |
3 | Standard test block | 1 | ||
4 | Cleaning brush (I) | 1 | ||
5 | Small support ring | 1 | ||
6 | Charger | 1 | ||
7 | Manual | 1 | ||
8 | Instrument package case | 1 | ||
Optional Configuration | 9 | Cleaning brush (II) | 1 | For use with G type impact device |
10 | Other type of impact devices and support rings | Refer to Table 3 and Table 4 in the appendix. | ||
11 | DataPro software | 1 | ||
12 | Communication cable | 1 | ||
13 | Micro Printer | 1 | ||
14 | Print cable | 1 |
Contact Person: Ms. Shifen Yuan
Tel: 8610 82921131,8613910983110
Fax: 86-10-82916893