Thickness range:0.8~9999mm (A scan) 0.8~500mm (C scan)
Single unit channel count:1-8 channels, transmit/receive split/combination selectable
Probe frequency:0.2~25MHz
Measurement element range::Aluminum (Al) - uranium (U)
Detector:SDD
Test time:10-40s
Measurement element range::Aluminum (Al) - uranium (U)
Detector:SDD
Test time:10-40s
Ambient temperature adaptability:5℃-40℃.
whole machine:1.25 kg
Class of protection:IP54 dustproof and waterproof.
Ambient temperature adaptability:5℃-40℃.
whole machine:1.25 kg
Class of protection:IP54 dustproof and waterproof.
Detector:Peltier effect cooled Fast-SDD detector,Resolution≤126eV
Analysis Element Range:From Mg to U,Detection content range:0.1ppm to 99.9% ,Depending on the type of object being tested, there are differences
X-ray source:Ag targets, tube voltage: 6~50kV, tube current :0~200μA
Detector:Peltier effect cooled Fast-SDD detector,Resolution≤126eV
Analysis Element Range:From Mg to U,Detection content range:0.1ppm to 99.9% ,Depending on the type of object being tested, there are differences
X-ray source:Ag targets, tube voltage: 6~50kV, tube current :0~200μA
Travel speed:≥100mm/
Accuracy:±1mm
Power consumption:≤150W
Material:90MnCrV8
Surface hardness:HRC63-70
Specification:φ50±0.05 X φ10.5±0.05X9.7±0.05
Material:90MnCrV8
Surface hardness:HRC63-70
Specification:φ50±0.05 X φ10.5±0.05X9.7±0.05
Test standard:MIL-STD-6866、ASME E1417P & WA TAM146040
Depth:106µm
Width:0.2~0.5µm
standard:ASTM E165 standard
Material:LY12 aluminum alloy
Colour:silvery white